The Film Sense FS‑1™ Multi-Wavelength Ellipsometer uses long-life LED’s and a no-moving-parts ellipsometric detector to provide fast and reliable thin film measurements in an easy-to-use, compact system.
The film thickness of most transparent thin films from 0 – 1000 nm can be determined with excellent precision and accuracy by a simple 1 second measurement. Optical constants n & k and other film properties can also be measured for many samples.
The FS‑1 offers the power of Multi-Wavelength Ellipsometry, but at the price point of single wavelength ellipsometer and spectroscopic reflectometer systems. The FS‑1 is ideal for measurements in the research lab, classroom, in situ process chambers, industrial quality control, and more.
Contact us to discuss if the FS‑1 is right for your thin film application.
In situ real time film growth monitoring with your smart Phone...!!
Easy to handle even from your desktop and no computer need.. the FS-1 ellipsometer is a very compact and light ( lees than 500 grams, 13x6x6 centimeters boxes, two heads source / detector small size boxes that you only need to fix on your cluster tool deposition or growth system such as ALD, CVD or film PVD cluster tools. You will then follow in real time and be able to monitor your system from your office with your tablet or smartphone (windows or android or apple).. Easy mounting in most optical windows designs without breaking vacuum.. and even here no workstation or PC laptop needed!!!
Such a light setting can be used as well on top of any other processing configuration like Langmuir Blodgett , (LB)trough, water surfactants controls, TIRE experiments or porosimetry , ect... and getting much more accuracy than usual instruments.
To be followed : Fs-1 with an IoT server with a low cost driver card server interface....